量产产品测试工程师(J13308)

1. Be responsible of DPPM continues reduction, stress/screen development and optimization. 2. Be responsible of new generation import defect mode study. 3. Be responsible of electrical failure analysis(EFA) of DPPM failure, identify the failure mechanism for continuous FAB process or design improvement. 4. Monitor production line DPPM performance, feedback process issues to FAB process engineer. 5. Be responsible of NAND DPPM test program development and maintenance, ensure delivery of test program in time. 【任职要求】 1. Any science and engineering related majors, master degree is preferred. 2. Understand CMOS device character; understand NAND flash product operation algorithms. 3. Capable of FAB process and design defect identification through electrical testing. 4. Capable of statistical data analysis and data mining. 5. C/C++ and Python capability. 6， Fluent English communication is a plus.