Metrology Sensor Development Engineer – Interferometry

Job Summary: We are seeking a highly skilled and motivated Metrology Sensor Development Engineer to lead the design, development, and integration of high-precision optical metrology sensors for advanced semiconductor inspection and metrology systems. This role focuses on white light interferometry (WLI) techniques to enable accurate 3D surface profiling and depth measurement for semiconductor wafers. ________________________________________ Key Responsibilities: • Design and develop optical metrology subsystems using laser or white light for nanoscale surface/topography measurement. • Collaborate with mechanical, electrical, and software teams to integrate optical sensors into inspection/metrology platforms. • Develop optical system models (e.g., Zemax, Code V) and simulate performance to optimize sensor accuracy and resolution. • Design and specify key optical components such as interferometers, light sources, projection optics, and detectors. • Conduct resolution, repeatability, and accuracy analysis for sensor systems in various wafer conditions. • Develop and validate sensor calibration procedures and alignment methodologies. • Interface with algorithm and signal processing teams to guide image reconstruction and 3D measurement extraction. • Perform detailed root-cause analysis of sensor performance issues and implement design improvements. • Support cross-functional product development efforts from prototyping through production. • Stay current with advancements in optical metrology, interferometry. ________________________________________ Qualifications: • Master’s or PhD in Optical Engineering, Physics, or a related field. • 5+ years of experience in optical metrology, preferably in the semiconductor industry. • Strong understanding of interferometry, and optical measurement principles. • Proficiency in optical design software (e.g., Zemax, Code V, or equivalent). • Hands-on experience with lab setup, optical alignment, and prototyping. • Familiarity with white light interferometers, confocal systems, or other 3D surface profiling technologies. • Experience with signal processing, data acquisition, or image analysis is desirable. • Excellent problem-solving, communication, and teamwork skills. ________________________________________ Preferred Skills: • Experience developing sensors for CD metrology, TSV depth measurement, or wafer topography. • Background in confocal or white light scanning interferometry. • Familiarity with cleanroom protocols and contamination control.