Software Algorithm Engineer

1. Defect detection algorithm development and optimization a. Design high-performance image processing algorithms for defect detection, defect classification, and more other application scenarios. b. Optimize existing algorithms to improve the accuracy and throughput, reduce the false rates, and make corresponding modification and adaption for different processing nodes. c. Research deep learning-based defect detection models, leverage transfer learning techniques to address practical manufacturing problems, and optimize models for real-time inspection requirements. 2. Image and signal processing a. Develop appropriate methods to image data or signal data collected from semiconductor inspection equipment. b. Implement traditional image processing algorithms, such as image enhancement, noise suppression, feature extraction, and template matching. Apply these to solve the practical metrology and inspection problems. 3. System integration and validation a. Collaborate with other teams to integrate image-processing algorithms into optical inspection systems, electron microscopes, or other equipment. b. Possess strong analytical and problem-solving skills, including the ability to quickly identify key factors in complex issues by data collection and logical reasoning. c. Test algo performance in production line, analyze results, and propose solutions for continuous and iterative algo optimizations. 4. Skill requirements a. Proficient in programing language, as C++ and python, and familiar with image processing library, as OpenCV and Halcon. b. Knowledgeable in semiconductor metrology/inspection principles and semiconductor process technology. c. Understanding of parallel computing and high-performance algorithm optimization. 5. Education a. Computer science, Electronic engineering, mathematics, or related fields. 1. 缺陷检测算法开发与优化 a. 设计高精度图像处理算法，用于缺陷检测，缺陷分类等应用场景。 b. 优化现有算法，提升检测准确率，降低误检率，提升检测速度，并针对不同工艺节点进行相应的算法改进。 c. 研究基于深度学习的缺陷检测模型，结合迁移学习技术，解决实际工艺中的问题，优化模型以适应实时检测需求。 2. 图像及信号处理 a. 设计合适的方法处理半导体检测设备采集的图像或信号数据。 b. 实现图像增强，噪声抑制，特征提取，模板匹配等传统图像处理算法，并与半导体量检测实际问题相结合。 3. 系统集成与验证 a. 与其他团队合作，将图像处理算法集成到光学检测系统或者电子显微镜等量检测设备中。 b. 具有分析并解决问题的能力，能够针对发生的问题，通过数据收集，逻辑推理对复杂问题的关键因素进行快速定位。 c. 在产线环境中测试算法性能，对结果进行分析，并给出解决方案，以对算法进行持续的迭代优化。 4. 技能要求 a. 熟练掌握C++，Python等编程语言，熟悉OpenCV，Halcon等图像处理库 b. 熟悉半导体量检测原理及半导体工艺知识 c. 了解并行计算及算法高性能优化 5. 教育背景 a. 计算机，电子工程，数学等相关专业